Life Testing and Reliability of Reed Switches

The Reed Switches and Reed sensors we manufacture undergo rigorous life testing to ensure reliability. Testing follows strict quality management system guidelines. Various tests check durability in different environments and load levels. This accelerated life testing process evaluates the performance of multiple reed switches or Reed Sensors over time. It simulates real-life conditions such as switching voltage and current to predict sensor behavior accurately. The failure criteria are weld or non operate, or a time based fail to operate or release signal.

Tests include primarily load cycling, and also temperature cycling, humidity exposure, and no-load mechanical stress assessment. These tests help ensure Reed Switch and sensor reliability and performance under diverse conditions. Durability tests assess sensor robustness for long-lasting use. The results help identify potential weaknesses and improve sensor design.

Accelerated life testing pushes sensors beyond normal operating limits. This test helps engineers anticipate failures and design more reliable products for a wide range of types of loads. Endurance testing evaluates sensor performance under continuous mechanical working stress. Results guide improvements in sensor blade design and glass sealing construction. Storage tests determine sensor lead plating deterioration over time. Results inform product lifespan estimates and maintenance schedules.
Customers benefit from enhanced sensor reliability and durability and our quality management systems ensure consistent product quality and customer satisfaction. We rely on life testing data to meet industry standards and exceed customer expectations. Testing also helps identify potential design flaws early in development.

All life tests are documented for internal reference and are not handed out to customers as the life of our products in the field depend on various parameters such as type of load (resistive, capacitive or inductive), switching voltage, switching current, and in-rush current, frequency of operation and ambient temperature. Therefore every load we test tends to change depending the circuit, environment, and various other factors.